X-Ray Energy dispersive spectrometry (X-EDS) methods can be used to analyse X-Rays emitted by samples irradiated by the electron beam of electron microscopes to obtain elemental information on the morphologically observed structures. This possibility allows a unique correlation of morphological and chemical data that finds extensive application in a wide field of scientific disciplines, ranging from Biology to the Materials Sciences and Geology (Ingram, et al., 1999). The power of the method builds upon the ability of electron microscopy to provide high resolution images of very small objects (down to the atomic level) and their topographical relationships, providing a way of probing the chemical composition of the observed structures.

Electron microscopy (EM) has been instrumental in the setup of important concepts in Biology and Materials Sciences from the middle of the XXth century onwards, and has many technical and scientific applications. However, being a labor intensive method that depends on expensive instrumentation, the technique remains somewhat neglected. Many of the problems that in the past could only be studied by EM are nowadays dealt with by alternative friendlier methodologies that were developed during the last two decades. However it remains the only method able to visualize ultrastructure, the morphology of matter down to the atomic level (a gain in resolution of more than 1000x compared to light microscope based methodologies).

Advances in electron microscopy and the need to visualize ultrastructure created by the advancing scientific knowledge of submicroscopic processes, is contributing to a new appreciation for electron microscopy-based methods, and particularly in microanalysis. As a consequence, renewed efforts for optimizing and facilitating the use of existing equipment and achieving international awareness of the Portuguese electron microscopy community are under way by the implementation of an electron microscopy network and by the efforts of the Portuguese Microscopy Society (SPMicros) to promote international events and partnerships.

Other imaging methods, using different types of beams (e.g.: ion beams) are also providing additional information on the chemical characteristics of the sample elements and molecules. Such an evolving environment is felt by working electron microscopists who are contacted by interested research groups and Institutions to provide help and advice on the implementation of such methods in the context of existing or proposed research projects.

The workshop is directed to all colleagues interested in microanalysis methods. It aims to provide pertinent knowledge concerning methods of electron microscopy and associated X‐EDS methods and their applications, and to introduce the less well known “Time of Flight Secondary Ion Mass Spectrometry” (TOF‐SIMS) method to interested researchers. This includes information on both basic knowledge and advanced state of the art methodologies provided by experts in the field. Additionally, participants will be able to discuss and seek advice for implementing the applications of EM and X-EDS in this context in a dedicated round table.

A practical demonstration will provide live experience of the methods, and may be used in preliminary observations of some samples from the participants.

Ingram, P., Shelburne, J.D., Roggli, V.L. & LeFurgey, A. (1999) Biomedical Applications of Microprobe Analysis, Academic Press, pp.545

Workshop Program

Morning sessions (FCUL)
09:00 Principles of Electron Microscopy - AP Alves de Matos (Curry Cabral Hospital)
09:45 Principles of X-ray Microanalysis - Carlos Sá (CEMUP)
10:30 Microanalysis by Surface Analysis Techniques - Orlando Teodoro (UNL)
11:45 Cofee break
12:00 Advances in Biomedical Electron Probe Microanalysis Imaging - P. Ingram (Duke University, NC, USA)
12:45 Structural and Chemical Microanatomy: Preservation Protocols for Microscopy and Microanalysis - Ann Le Furgey (Duke University, NC, USA)
13:30 Lunch

Afternoon sessions (IST, Microlab)
15:00 Round Table
16:00 Practical demonstration (limited to 15 participants)
18:00 Closing Session